Fab EDA

• SPICE Model

  • Baseband Modeling / BSIMProPlus
  • RF Modeling / MeQLab
  • Model Extraction Automation / SDEP
  • Model QA / ME-Pro

• PDK

  • PCell Development / PCellLab
  • PDK Verification / PQLab

• Standard Cell

  • Library Characterization / NanoCell
  • Library Validation / LibWiz

• Fabrication

  • Lithography Modeling and Simulation / FabLitho
  • Reticle Automated Design / FAR

AMS Design EDA

• Design Environment

  • Schematic Capture / NanoDesigner SE
  • Layout Editor / NanoDesigner LS
  • Interactive Physical Verification / NanoDesigner iV
  • Design Optimization / NanoDesigner Optimizer

• Circuit Simulation

  • SPICE Simulator / NanoSpice
  • SPICE Simulator / NanoSpice X
  • SPICE Simulator / NanoSpice Giga
  • FastSPICE Simulator / NanoSpice Pro
  • FastSPICE Simulator / NanoSpice Pro X
  • Mixed Signal / NanoSpice MS
  • Waveform Analysis / NanoWave

• Circuit Analysis

  • Static and Dynamic Circuit Check / NanoSpice CCK
  • Yield Analysis / NanoYield
  • Signal Integrity / NanoSpice SI
  • Critical Path Analysis / PathInspector
  • Power Device Design Verification / PTM
  • ESD Verification / ESDi

Digital Design EDA

• Circuit Simulation

  • Digital Simulation / VeriSim

• Standard Cell

  • Library Characterization / NanoCell
  • Library Validation / LibWiz

• Design & Verification

  • Timing Analysis / TRASTA
  • Floor Planning / NavisPro
  • Signal Integrity Analysis / NanoSpice SI
  • Power Design Analysis / PTM
  • ESD Verification / ESDi
  • Chip-to-Package Connectivity Verification / PadInspector

IP Design

• Foundation IP

  • Foundation IP / Standard Cell
  • Foundation IP / SRAM
  • Foundation IP / GPIO
  • Foundation IP / eFUSE

• 模拟/混合信号/射频IP

  • High Performance RF IP / BLE/BT
  • High Performance RF IP / Wi-Fi6 2.4G & 5G
  • High Performance RF IP / SLB/SLE
  • High Performance RF IP / UWB
  • High Performance RF IP / POR/PDR/BOR/Bandgap
  • High Performance RF IP / LDO
  • High Performance RF IP / DCDC
  • High Performance RF IP / PMU
  • High Performance/Low Power Analog IP / PLL
  • High Performance/Low Power Analog IP / RC OSC
  • High Performance/Low Power Analog IP / Crystal OSC
  • High Performance/Low Power Analog IP / PVT/Glitch Sensor
  • High Performance/Low Power Analog IP / ADC
  • High Performance/Low Power Analog IP / DAC
  • High Performance/Low Power Analog IP / CODEC

• 接口IP

  • Data Exchange / JESD204B/C
  • Data Exchange / SerDes
  • Data Exchange / UCle
  • Peripheral Transmission / PCIE
  • Peripheral Transmission / USB
  • Peripheral Transmission / SATA
  • Peripheral Transmission / SAS
  • Image Transmission / MIPI
  • Image Transmission / LVDS
  • Image Transmission / CVI
  • Image Transmission / DisplayPort/
    eDP

• 存储IP

  • High Reliability eNVM IP / MTP
  • High Reliability eNVM IP / OTP
  • High Reliability eNVM IP / eFlash
  • High Reliability eNVM IP / EEPROM

Testing Systems

• Parametric Testing

  • Semiconductor Parametric Analyzer / FS-Pro
  • Semiconductor Parametric Analyzer / FS800

• Noise Measurement

  • Low Frequency Noise / 9812DX
  • Low Frequency Noise / 9812E
  • Low Frequency Noise / 9812HF
  • AC Dynamic Noise / 9812AC

• Integrated Testing

  • Electrical Parameter Testing Software / LabExpress

• Benchtop Instrument

  • Source Measure Unit / P1800

Design Enablement Services

• Wafer Testing

  • Data Testing / Data Acquisition & Characterization

• SPICE Modeling

  • SPICE Modeling / Model Extraction & QA

• Testchip Design

  • Testkey & Layout / Testkey Design & Layout

• New Device

  • New Device / New Device Solutions

• PDK Development

  • PDK / Development & Verification

• IP Development

  • Standard Cell Library & IP Cores / Characterization & Development

DTCO

Design Enablement

IC Simulation & Verification

Full Custom Design

Standard Cell Library Design Acceleration

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